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MIL-PRF-914 Resistor Networks, Fixed, Film, Surface Mount, Nonestablished Reliability, And Established Reliability, General Specification ForThis specification covers the general requirements for nonestablished reliability \(non-ER\) and established reliability \(ER\), hermetically sealed \(see 3.27\) and nonhermetically sealed networks \(see 3.27.1\). These networks consist entirely of fixed, film resistors. They are primarily intended for use in surface mount applications where space is a major concern. ER resistors covered by this specification will have life failure rates \(FR\) ranging from 1 percent to 0.001 percent per 1,000 hours \(see 1.2.1.7\). The ER FR are established at a minimum 60-percent confidence level on the basis of life tests. Designers are CAUTIONED on using these resistors in pulse applications \(see 6.4.4\).

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MIL-PRF-914C
TABLE XII. Qualification inspection.
Defects
Requirement
Method
Number of
Inspection
sample units 1/
allowed 2/
paragraph
paragraph
Group I 3/ 4/
Thermal shock
Power conditioning
All sample units
0
DC resistance
Hermetic seal (when applicable)
Group IA 3/ 5/
Visual and mechanical inspection
inclusive and 3.31
All sample units
0
through 3.31.4 inclusive
Group II 6/
5 samples any value
0
Solderability
Group III 6/
12 samples any value
Resistance to solvents
Group IV
Resistance-temperature characteristic
20 10 high
Low temperature operation
or 10 critical 7/
1
Short-time overload
30 10 low
Terminal strength (not applicable to LCC)
Hermetic seal (when applicable)
Group IVA
Adhesion
8 samples any value
1
(not applicable to gullwing packages)
Group V
Thermal shock
Dielectric withstanding voltage
20 10 high
Insulation resistance
or 10 critical 7/
1
Resistance to soldering heat
30 10 low
Moisture resistance
Hermetic seal (when applicable)
Group VI
20 10 high
Shock, specified pulse
or 10 critical 7/
1
Vibration, high frequency
30 10 low
Hermetic seal (when applicable)
Group VII
34 high
Life
102 34 critical 8/
1
34 low
Group VIII
20 10 high
High temperature exposure
or 10 critical 7/
1
Low temperature storage
30 10 low
Group IX
20 10 high
Steady-state humidity
or 10 critical 7/
1
30 10 low
Group X
10
0
Fungus
1/  See appendix A for details.
2/  Failure of a single network in one or more tests of a group shall be charged as a single failure.
3/  Nondestructive tests.
4/  Networks shall meet all requirements of group I before subjecting to group II through group IX.
5/  Marking shall be considered defective if the marking is illegible or incorrect.
6/  Test may be performed on electrical rejects.
7/  When no critical value is specified, only the highest and lowest resistance values shall be tested (20 samples, total).
8/  When no critical value is specified, only the 51 highest and 51 lowest resistance values are tested.
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