MIL-PRF-914 Resistor Networks, Fixed, Film, Surface Mount, Nonestablished Reliability, And Established Reliability, General Specification ForThis specification covers the general requirements for nonestablished reliability \(non-ER\) and established reliability \(ER\), hermetically sealed \(see 3.27\) and nonhermetically sealed networks \(see 3.27.1\). These networks consist entirely of fixed, film resistors. They are primarily intended for use in surface mount applications where space is a major concern. ER resistors covered by this specification will have life failure rates \(FR\) ranging from 1 percent to 0.001 percent per 1,000 hours \(see 1.2.1.7\). The ER FR are established at a minimum 60-percent confidence level on the basis of life tests. Designers are CAUTIONED on using these resistors in pulse applications \(see 6.4.4\).

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MIL-PRF-914C

4.8.8 Resistance-temperature characteristic (see 3.13). Networks shall be tested in accordance with method 304

of MIL-STD-202. The following details and exceptions shall apply:

Mounting: Method A or method B (see 4.8.1).

Reference temperature: Room ambient temperature.

Test temperature: In accordance with table XIX.

TABLE XIX. Resistance-temperature characteristic.

Temperature in C

Sequence

Qualification

Group B

inspection

25 �3 1/

-15 �3

-55 �3

25 �3 1/

125 �3

65 �3

25 �3 1/

125 �3

1/ This temperature shall be considered the

reference temperature for each of the

succeeding temperatures.

NOTE: At the option of the manufacturer, group B inspection may be in the reverse sequence of table XIX as

follows:

25OC

�3OC.

125 C

25OC

�3OC.

-55 C

4.8.9 Low temperature operation (see 3.14). Resistors shall be mounted as specified in 4.8.1, method A or

method B. Following a dc resistance measurement as specified in 4.8.5, the networks shall be placed in a cold

chamber at -65OC +0OC, -5OC. After 1 hour of stabilization at this temperature, full rated continuous working voltage

as specified in 3.7 shall be applied for 45 minutes +5 minutes, -0 minutes. The networks may be loaded individually

or in parallel. Fifteen minutes +5 minutes, -0 minutes after the removal of the voltage, the temperature in the

chamber shall be gradually increased to room temperature within a period of not more than 8 hours. The networks

shall be removed from the chamber and maintained at a temperature of 25OC �5OC; the dc resistance shall be

measured as specified in 4.8.5. Networks shall be inspected for evidence of mechanical damage.