MIL-PRF-914 Resistor Networks, Fixed, Film, Surface Mount, Nonestablished Reliability, And Established Reliability, General Specification ForThis specification covers the general requirements for nonestablished reliability \(non-ER\) and established reliability \(ER\), hermetically sealed \(see 3.27\) and nonhermetically sealed networks \(see 3.27.1\). These networks consist entirely of fixed, film resistors. They are primarily intended for use in surface mount applications where space is a major concern. ER resistors covered by this specification will have life failure rates \(FR\) ranging from 1 percent to 0.001 percent per 1,000 hours \(see 1.2.1.7\). The ER FR are established at a minimum 60-percent confidence level on the basis of life tests. Designers are CAUTIONED on using these resistors in pulse applications \(see 6.4.4\).

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MIL-PRF-914C

3.27 Hermetic seal (applicable to characteristic C) (see 4.8.22). For the purpose of this specification, a

hermetically sealed network is one which shall be capable of passing the seal test specified in 4.8.22 or of meeting a

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leak rate requirement of not more than 5.0 x 10 cubic centimeters per second. Characteristic C networks may be

furnished against H and V requirements (see 3.31.3).

3.27.1 Nonhermetic seal (applicable to characteristics H, K, M, R, and V). For the purpose of this specification, a

nonhermetically sealed network is one not conforming in full to the requirements of 3.27. Characteristics H, K, M, R,

and V networks shall not be furnished against characteristic C requirements.

3.28 Steady-state humidity. When networks are tested as specified in 4.8.23, there shall be no evidence of

mechanical damage. The change in resistance between initial and final measurements shall not exceed the values

specified:

Characteristic

Delta R

Resistance ratio

K, and M

�(0.50 percent +0.01 ohm)

�(0.40 percent +0.01 ohm)

C, R, and V

�(0.20 percent +0.01 ohm)

�0.02 percent

Additionally, the dielectric withstanding voltage shall be as specified in 3.18 and the insulation resistance shall be 100

megohms minimum.

3.29 Bond pull (applicable to configuration C of styles RNS030 and RNS040). When networks are tested as

specified in 4.8.24, all bonds shall remain undamaged, with no pad lifting or pull away.

3.30 Fungus. All external materials shall be nonnutrient to fungus growth. The manufacturer shall verify by

certification that all external materials are fungus resistant or shall test the resistors as specified in 4.8.25. There

shall be no evidence of fungus growth on the external surfaces.

3.31 Marking. Each network shall be marked in accordance with MIL-STD-1285 and as indicated below in the

following order:

Complete PIN.

Manufacturer's CAGE code.

Manufacturing date code and "JAN" marking.

Pin number 1 identifier (see 3.1).

3.31.1 Minimum marking. When the physical size of the resistor style precludes the marking (see 3.31), the

minimum marking required shall be as specified in the associated specification (see 3.1). Marking shall remain

legible at the end of all tests. In those cases where full marking is not on the resistor body, the full marking shall be

marked on the unit package.