For Parts Inquiries call (727) 344-9615
A Service Disabled Veteran Owned Small Business
© Copyright 2015 Integrated Publishing, Inc.

MIL-PRF-914 Resistor Networks, Fixed, Film, Surface Mount, Nonestablished Reliability, And Established Reliability, General Specification ForThis specification covers the general requirements for nonestablished reliability \(non-ER\) and established reliability \(ER\), hermetically sealed \(see 3.27\) and nonhermetically sealed networks \(see 3.27.1\). These networks consist entirely of fixed, film resistors. They are primarily intended for use in surface mount applications where space is a major concern. ER resistors covered by this specification will have life failure rates \(FR\) ranging from 1 percent to 0.001 percent per 1,000 hours \(see 1.2.1.7\). The ER FR are established at a minimum 60-percent confidence level on the basis of life tests. Designers are CAUTIONED on using these resistors in pulse applications \(see 6.4.4\).

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10


. . . . . .
MIL-PRF-914C
3.22 Shock (specified pulse). When networks are tested as specified in 4.8.17, there shall be no evidence of
mechanical damage. The change in resistance between initial and final measurements shall not exceed the values
specified:
Delta R
Resistance ratio
Characteristic
K, M and H
±(0.25 percent +0.01 ohm)
C, R, and V
±(0.25 percent +0.01 ohm)
±0.03 percent
3.23 Vibration, high frequency. When networks are tested as specified in 4.8.18, there shall be no mechanical
damage. The change in resistance between initial and final measurements shall not exceed the values specified:
Delta R
Resistance ratio
Characteristic
K, M and H
±(0.25 percent +0.01 ohm)
C, R, and V
±(0.25 percent +0.01 ohm)
±0.03 percent
3.24 Life.
3.24.1 Qualification. When networks are tested as specified in 4.8.19, there shall be no evidence of mechanical
damage. The change in resistance between initial and final measurements shall not exceed the value specified:
Characteristic
Delta R
Resistance ratio
M
±(2.00 percent +0.01 ohm)
K, and H
±(0.50 percent +0.01 ohm)
C, R, and V
±(0.50 percent +0.01 ohm)
±0.03 percent
3.24.2 FR determination (ER styles only). When resistors are tested as specified in 4.8.19, there shall be no
evidence of mechanical damage to the resistance element or enclosure. The change in resistance between the initial
measurement and any of the succeeding measurements shall not exceed the value specified in table I. This single
failure criteria shall be applicable to all measurements during the life test for purposes of determining FRL
qualification and is applicable as a parallel requirement with 3.24.1 to the measurements made during the life test
specified for qualification.
3.25 High temperature exposure. When networks are tested as specified in 4.8.20, there shall be no evidence of
mechanical damage. The change in resistance between initial and final measurements shall not exceed the values
specified:
Characteristic
Delta R
Resistance ratio
M
±(1.00 percent +0.01 ohm)
K
±(0.50 percent +0.01 ohm)
H
±(0.20 percent +0.01 ohm)
C, R, and V
±(0.10 percent +0.01 ohm)
±0.03 percent
3.26 Low temperature storage. When networks are tested as specified in 4.8.21, there shall be no evidence of
mechanical damage. The change in resistance between initial and final measurements shall not exceed the values
specified:
Characteristic
Delta R
Resistance ratio
M
±(0.50 percent +0.01 ohm)
K
±(0.25 percent +0.01 ohm)
H
±(0.10 percent +0.01 ohm)
C, R, and V
±(0.10 percent +0.01 ohm)
±0.02 percent
12



For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business

© Copyright 2015 Integrated Publishing, Inc. Site Design & Marketing by Strategico.