MIL-R-10509J
4.6.3.1.3 Subgroup 3 (solderability).
4.6.3.1.3.1 Sampling plan. Thirteen samples shall be selected randomly from each inspection lot and subjected to the subgroup 3 solderability test. If there are one or more defects, the lot shall be considered to have failed.
4.6.3.1.3.2 Rejected lots. In the event of one or more defects, the inspection lot is rejected. The manufacturer may use one of the following options to rework the lot:
a. Each production lot that was used to form the failed inspection lot shall be individually submitted to the solderability test as required in 4.7.14. Production lots that pass the solderability test are available for shipment. Production lots failing the solderability test can be reworked only if submitted to the solder dip procedure in 4.6.3.1.3.2b.
b. The manufacturer submits the failed lot to a 100 percent solder dip using an approved solder dip process in accordance with 3.4.2. Following the solder dip, the electrical measurements required in group A, subgroup 1 tests shall be repeated on the lot. Thirteen additional samples shall then be selected and subjected to the solderability test with zero defects allowed. If the lot fails this solderability test the lot shall be reworked a second time and retested. If the lot fails the second rework, the lot shall be considered rejected and shall not be furnished against the requirements of this specification.
4.6.3.1.3.3 Disposition of samples. The solderability test is considered a destructive test and samples submitted to the solderability test shall not be supplied on the contract.
4.6.4 Group B inspection. Group B inspection shall consist of the tests specified in table VIII, in the order shown. They shall be performed on sample units that have been subjected to and have passed the group A inspection, unless the Government considers it more practical to select a separate sample from the lot for group B inspection.
TABLE VIII. Group B inspection. 1/
Inspection |
Requirement paragraph |
Method paragraph |
Number of samples |
Resistance temperature characteristic Seal (as applicable) |
3.17 3.8 |
4.7.12 4.7.3 |
4.6.4.1 |
1/ If the manufacturer can demonstrate that this test has been performed five consecutive times with zeros failures, the frequency of this test(s), with the approval of the qualifying activity, can be performed on an annual basis. If the design, material, construction, or processing of the part is changed, or if there are any qualifying problems or failures the qualifying activity may require resumption of the original test frequency.
4.6.4.1 Sampling plan. A sample of 13 parts shall be randomly selected, if one or more defects are found, the lot shall be rescreened and defects removed. After screening and removal of defects, a new sample of 13 parts shall be randomly selected, if one or more defects are found in the second sample, the lot shall be rejected and shall not be supplied to this specification.
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