MIL-R-10509J
3.14 Insulation resistance. When resistors are tested as specified in 4.7.9, the insulation resistance shall not be less than 10,000 megohms.
3.15 Resistance to solder heat. When resistors are tested as specified in 4.7.10, there shall be no evidence of mechanical damage. The change in resistance shall not exceed ±(0.5 percent + 0.05 ohm) for characteristic D, and ±(0.1 percent + 0.05 ohm) for characteristic C, characteristic E, characteristic F, and characteristic G.
3.16 Moisture resistance. When resistors are tested as specified in 4.7.11, there shall be no evidence of mechanical damage. The change in resistance between the initial and the final measurements shall
not exceed applicable value specified in table I. In addition, the dielectric withstanding voltage shall be as specified in 3.13, and the insulation resistance shall be 100 megohms, minimum.
3.17 Resistance temperature characteristic. When resistors are tested as specified in 4.7.12, the resistance temperature characteristic, at each of the temperature specified in 4.7.12b, referred to room ambient temperature, shall not exceed the value specified in table I for the applicable characteristic.
3.18 Life. When resistors are tested as specified in 4.7.13, there shall be no evidence of mechanical damage. The change in resistance between the initial measurement and any of the succeeding measurements shall not exceed ±(1.0 percent + 0.05 ohm) for characteristic D, and ±(0.5 percent + 0.05 ohm) for characteristic C, characteristic E, characteristic F, and characteristic G.
3.19 Solderability. When resistors are tested as specified in 4.7.14, the dipped surface of the leads shall be at least 95 percent covered with a new, smooth, solder coating. The remaining 5 percent of the lead surface shall show only small pinholes or rough spots; these shall not be concentrated in one area. Bare base metal and areas where the solder dip failed to cover the original coating are indications of poor solderability, and shall be cause for failure. In case of dispute, the percent of coverage with pinholes or rough spots shall be determined by actual measurement of this area, as compared to the total area.
3.20 Shock (specified pulse). When resistors are tested as specified in 4.7.15, there shall be no evidence of mechanical or electrical damage. The change in resistance shall not exceed ±(0.5 percent +
0.05 ohm) for characteristic D, and ±(0.25 percent + 0.05 ohm) for characteristic C, characteristic E, characteristic F, and characteristic G. There shall be no electrical discontinuity during the test.
3.21 Vibration, high frequency. When resistors are tested as specified in 4.7.16, there shall be no evidence of mechanical or electrical damage. The change in resistance shall not exceed ±(0.5 percent
+ 0.05 ohm) for characteristic D, and ±(0.25 percent + 0.05 ohm) for characteristic C, characteristic E, characteristic F, and characteristic G. There shall be no electrical discontinuity during the test.
3.22 Resistance to solvents. When resistors are tested as specified in 4.7.17, there shall be evidence of mechanical damage and the marking shall remain legible.
3.23 Soldering. Electrical connections shall be mechanically secure before and electrically continuous after soldering.
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