MIL-PRF-19E
TABLE XII Group B sampling plan.
Subgroup 1
Lot size
sampling plan
1 to
25
3
26 to
50
5
51 to
90
6
91 to
150
7
151 to
280
10
281 to
500
11
501 to
1,200
15
1,201 to
3,200
18
3,201 to
10,000
22
10,001 and over
29
4.7 Methods of examination and test.
4.7.1 Visual and mechanical examination. Resistors shall be examined to verify that the materials, design.
construction, physical dimension, marking, and workmanship are in accordance with the applicable requirements
4.7.2 Dielectric withstanding voltage (see 3.7).
4.7.2.1 Atmospheric pressure. Resistors shall be tested in accordance with method 301 of MIL-STD-202. The
following details shall apply:
a.
Test potential: 900 volts root-mean-square (rms).
b.
Potential: From an alternating current (ac) supply at commercial line frequency and waveform.
c.
Points of application of test voltage: Between the terminals tied together and the external metal portions of
the resistors and metal mounting plate.
d.
Examination and measurements: During the tests, the leakage current shall be measured. At the
conclusion of the test, resistors shall be examined for evidence of mechanical damage.
4.7.2.2 Barometric pressure. Resistors shall be tested in accordance with method 105 of MIL-STD-202. A
potential of 450 volts rms (or as specified, see 3.1), from an alternating-current at commercial line frequency, and
waveform of not more than 100 hertz shall be applied for 1 minute between all terminals connected together and
bushing.
4.7.3 DC resistance (see 3.8). Resistors shall be tested in accordance with method 303 of MIL-STD-202. The
following details shall apply:
a.
Measuring apparatus: Different types of measuring test equipment (multimeter, bridges, or equivalent) are
permitted to be used on the initial and final readings of this test, provided the equipment is the same style,
model, or it can be shown that the performance of the equipment is equivalent. The supplier shall establish
and maintain a calibration system in accordance with NCSL Z540-1, ISO 10012-1, or equivalent system as
approved by the qualifying activity.
b.
Measurement energy for electronic test equipment: The measurement energy applied to the unit under test
shall not exceed 10 percent of the +25OC rated wattage times 1 second.
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