MIL-PRF-39009E
TABLE V. Qualification inspection.
Defects
Inspection
Requirement
Method
Number of
paragraph
paragraph
sample units 1/
allowed 2/
Group I 3/
Conditioning
N/A 4/
All sample units
DC resistance
Group IA
Visual and mechanical
All sample units
0
thru 3.5.5 incl.,
inspection 5/
and 3.24 thru
3.27 incl.
Group II
Resistance temperature
characteristic 6/
Low temperature storage
Dielectric withstanding voltage 6/
12 highest value
24
1
Insulation resistance
12 1-ohm or lowest value,
Low temperature operation
whichever is higher
Short time overload 6/
Moisture resistance
Terminal strength
Group III
12 highest value
24
Shock, (specified pulse)
1
12 1-ohm or lowest value,
Vibration, high frequency
whichever is higher
Group IV
34 highest value
34 1,000-ohm
Life
102
1
34 1-ohm or lowest value
whichever is greater
Group V
27 each
9 highest
102
High temperature exposure
style
9 1,000-ohm
minimum
1
submitted
9 1-ohm
sample
size
Group VI
Solderability 7/
10 both leads, any value
0
1/ See appendix A for details.
2/ Failure of a resistor in one or more tests of a group shall be charged as a single defect.
3/ These tests shall not be performed if a manufacturer presents certified data proving tests have been
performed on the qualification sample.
4/ All units shall meet group I requirements before being subjected to subsequent qualification test
groups.
5/ Marking shall be considered defective if illegible or missing. Marking shall remain legible at the end of
all tests.
6/ Nondestructive tests.
7/ Sample shall not be subjected to group I and group IA.
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