MIL-PRF-39009E
2.3 Non-Government publications. The following documents form a part of this document to the extent
specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
ELECTRONIC INDUSTRIES ASSOCIATION (EIA)
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Assessment of Outgoing Nonconforming Levels in Parts Per Million (ppm).
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Statistical Process Control Systems.
(Application for copies should be addressed to Electronic Industries Association (EI, 2500 Wilson
Boulevard, Arlington, VA 22201-3834.)
2.4 Order of precedence. In the event of a conflict between the text of this document, and the
references cited herein (except for related specification sheets) the text of this document takes
precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS.
3.1 Specification sheets. The individual item requirements shall be as specified herein and in
accordance with the applicable specification sheet. In the event of any conflict between the requirements
of this specification and the specification sheet, the latter shall govern.
3.2 Qualification. Resistors furnished under this specification shall be products that are authorized by
the qualifying activity for listing on the applicable Qualified Products List (QPL), before contract award (see
3.3 QPL system. The manufacturer shall establish and maintain a QPL system for parts covered by
this specification. Requirements for this system are specified in MIL-STD-790 (all product levels) and
MIL-STD-690 (ER parts only). The manufacturer shall also establish a Statistical Process Control (SPC),
Part Per Million (PPM) and characterizing circuit reactance systems that meets the requirements as
described in 3.3.1 and 3.3.2, respectively.
3.3.1 SPC system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a
SPC system that meets the requirements of EIA-557. Typical manufacturing processes for application of
SPC include dc resistance values, cap/lead attachment, trimming, encapsulation, and weld strength. In
addition, the manufacturer shall demonstrate resistance temperature characteristic (RTC) control in the
process.
3.3.2 PPM system. As part of the overall MIL-STD-790 QPL system, the manufacturer shall establish a
PPM system for assessing the average outgoing quality of lots in accordance with EIA-554-1 and 4.6.4.
Data exclusion, in accordance with EIA-554-1, may be used with approval of the qualifying activity. The
PPM system shall identify the PPM rate at the end of each month and shall be based on a six month
moving average. PPM and dc resistance shall be assessed for each style. Style reporting may include
both non-ER and ER style combinations.
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