MIL-PRF-39009E
3.13 Low temperature operation. When resistors are tested as specified in 4.8.7, there shall be no
evidence of mechanical damage which will result in degradation of performance. The change in
resistance shall not exceed ±(0.3 percent +0.01 ohm).
3.14 Short time overload. When resistors are tested as specified in 4.8.8, there shall be no evidence of
mechanical damage; the change in resistance shall not exceed ±(0.3 percent +0.01 ohm).
3.15 Moisture resistance. When resistors are tested as specified in 4.8.9, there shall be no evidence of
breaking, cracking, loosening of terminals, or corrosion; the change in resistance shall not exceed ±(0.5
percent +0.01 ohm). In addition, the insulation resistance shall not be less than 1,000 megohms.
3.16 Terminal strength. When resistors are tested as specified in 4.8.10, there shall be no evidence of
mechanical damage. The change in resistance shall not exceed ±(0.2 percent +0.01 ohm).
3.17 Shock (specified pulse). When resistors are tested as specified in 4.8.11, there shall be no
evidence of mechanical or electrical damage; the change in resistance shall not exceed ±(0.2 percent
+0.01 ohm). There shall be no electrical discontinuity during the test. Resistors shall meet the dielectric
withstanding voltage requirements specified in 3.11.
3.18 Vibration, high frequency. When resistors are tested as specified in 4.8.12, there shall be no
evidence of mechanical damage; the change in resistance shall not exceed ±(0.2 percent +0.01 ohm).
There shall be no electrical discontinuity during the test. Resistors shall meet the dielectric withstanding
voltage requirements specified in 3.11.
3.19 Life.
3.19.1 Qualification inspection. When resistors are tested as specified in 4.8.13, there shall be no
evidence of mechanical damage to the resistance element, coating, or enclosure. The change in
resistance between the initial measurement and any succeeding measurement up to and including 2,000
hours shall not exceed ±(1.0 percent +0.01 ohm).
3.19.2 FR determination (extend FR test). When resistors are tested as specified in 4.8.13, there shall
be no evidence of mechanical damage to the resistance element, coating, or enclosure. The change in
resistance between the initial measurement shall not exceed ±(2.0 percent +0.01 ohm). This single failure
criteria shall be applicable to all measurements during the life test for purposes of determining FR level
qualification and is applicable as a parallel requirement with 3.19.1 to the measurement made during the
life tests specified for qualification inspection.
3.20 High temperature exposure. When resistors are tested as specified in 4.8.14, there shall be no
evidence of mechanical damage and the change in resistance shall not exceed ±(1.0 percent +0.05 ohm).
3.21 Solderability. When resistors are tested as specified 4.8.15, the flat portion of the terminal shall be
considered as the solderable area, and meet the criteria for lug or tab terminal evaluation in the test
method.
3.22 Low temperature storage. When resistors are tested as specified in 4.8.16, there shall be no
evidence of mechanical damage. The change in resistance shall not exceed ±(0.3 percent +0.01 ohm).
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