MIL-PRF-49462C
4.6.2.1.2 Subgroup II. A sample of parts from each inspection lot shall be randomly selected in
accordance with table VII, if one or more defects are found, the lot shall be rescreened and defects
removed. After screening and removal of defects, a new sample of parts shall be randomly selected in
accordance with table VII, if one or more defects are found in the second sample, the lot shall be rejected
and shall not be supplied to this specification. .
TABLE VII. Group A sampling plan.
Lot size
Subgroup II
sample size
100%
2 to
13
13
14 to
125
13
126 to
150
20
151 to
280
29
281 to
500
34
501 to 1,201
42
1,201 to 3,201
50
3,201 to 10,000
60
10,001 to 35,000
74
35,001 to 150,000
90
150,001 to 500,000
102
500,001 and over
4.6.2.1.3 Subgroup III (solderability).
4.6.2.1.3.1 Sampling plan. Thirteen samples shall be selected randomly from each inspection lot and
subjected to the subgroup III solderability test. The manufacturer may use electrical rejects from the
subgroup I screening tests for all or part of the samples to be used for solderability testing. If there are
one or more defects, the lot shall be considered to have failed.
4.6.2.1.3.2 Rejected lots. In the event of one or more defects, the inspection lot is rejected. The
manufacturer may use of the following options to rework the lot:
a. Each production lot that was used to form the failed inspection lot shall be individually submitted to
the solderability test as required in 4.8.4. Production lots that pass the solderability tests are
available for shipment. Production lots failing the solderability test can be reworked only if
submitted to the solder dip procedure as specified in 4.6.2.1.3.2b.
b. The manufacturer submits the failed lot to a 100 percent solder dip using an approved solder dip
process in accordance with the appendix A. Following the solder dip, the electrical measurements
required in group A, subgroup 1 tests shall be repeated on 100 percent of the lot. Lot acceptance
for the electrical measurements shall be as for the subgroup 1 tests. Thirteen additional samples
shall then be selected and subjected to the solderability test with zero defects allowed. If the lot
fails this solderability test the lot may be rework a second time and be retested. If the lot fails the
second reworked, the lot shall be considered rejected and shall not be furnished against the
requirements of this specification.
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