MIL-PRF-49462C
APPENDIX A
PROCEDURE FOR QUALIFICATION INSPECTION
A.1 SCOPE
A.1.1 Scope. This appendix details the procedures for submission of samples for qualification
inspection of resistors covered by this specification. The procedure for extending qualification of the
required sample to other resistors covered by this specification is also outlined herein. This is a
mandatory part of the specification. The information contained herein is intended for compliance.
A.2. APPLICABLE DOCUMENTS
A.2.1 General. The documents listed in this section are specified in sections 3, 4, and 5 of this
specification. This section does not include documents cited in other sections of this specification or
recommended for additional information or as examples. While every effort has been made to ensure the
completeness of this list, document users are cautioned that they meet all specified requirements
documents cited in sections 3, 4, and 5 of this specification, whether or not they are listed.
A.2.2 Government documents.
A.2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and
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handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the
issues of these documents are those listed in the solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
- Leads, for Electronic Components Parts.
(Copies of these documents are available online at https://assist.daps.dla.mil/quisksearch/ or from the
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Standard Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
A.2.3 Order of precedence. In the event of a conflict between the text of this document and the
references cited herein (except for associated specifications, specification sheets, or MS sheets), the text
of this document takes precedence. Nothing in this document, however, supersedes applicable laws and
regulations unless a specific exemption has been obtained.
A.3. SUBMISSION
A.3.1 Sample. A sample having any specification resistance tolerance in each style and characteristic
for which qualification is sought shall be submitted and subjected to the inspection of table V. Sample
size submission and distribution shall be as in table A-I.
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