MIL-PRF-49462C
3.4.2 Films. The films shall be uniformly deposited. The film shall be free of blisters, thin spots, areas
inadequately bonded to the core, discolored spots or other blemishes likely to cause flaking or a
nonuniform ribbon when spiraled (helixed). Where used, spiraling shall occupy no less than 70 percent of
the resistor element actual length. The resistor element actual length shall be defined as the nominal
distance between terminal bands less 0.046875 inch.
3.4.2.1 Carbon films. Carbon films shall not be used.
3.4.3 End caps. When end caps are used in construction of the resistor, the misalignment of the cap
with respect to the core shall not exceed 5 degrees.
3.5 Power rating. Power rating is based on continuous full load operation at a rated ambient
temperature. See the applicable specification sheet (see 3.1) for the applicable derating curve.
3.6 Voltage rating. Resistor shall have a rated dc continuous working voltage or an approximate sine-
wave root mean square (rms) continuous working voltage corresponding to the wattage (power) rating, as
determined from the following formula:
E = PR
Where: E = Continuous rated dc or rms working voltage in volts.
P = Rated wattage in watts.
R = Nominal resistance in ohms.
In no case shall the rated voltage be greater than the applicable maximum voltage.
3.7 DC resistance. When resistors are tested as specified in 4.8.2, the dc resistance shall be within
the specified tolerance of the nominal resistance (see 1.2.1.3), and shall be stable within the specified
tolerance during the measurement.
*
3.7.1 Resistance value deviations. All maximum deviations as specified in this section are to be
considered absolute limits with the exception of the contact resistance adjustments.
3.8 Power conditioning. When resistors are tested as specified in 4.8.3, there shall be no evidence of
mechanical damage and the change in resistance shall not exceed ±0.5 percent.
3.9 Solderability. The dipped surface of the leads of the resistor tested as specified in 4.8.4, shall be at
least 95 percent covered with a new, smooth coating and shall exhibit no demetallization or leaching of
terminal areas. The remaining 5 percent may contain only pin holes or rough spots, which shall not be
concentrated in one area. In case of dispute, the percentage of coverage with pinholes or rough spots
shall be determined by actual measurement of these areas, as compared to the total area.
3.10 Resistance to solvents. When resistors are tested as specified in 4.8.5, there shall be no
evidence of mechanical damage and marking shall remain legible.
3.11 Thermal shock. When resistors are tested as specified in 4.8.6, there shall be no evidence of
mechanical damage. The change in resistance shall not exceed ±0.5 percent.
3.12 Low temperature operation. When resistors are tested as specified in 4.8.7, there shall be no
evidence of mechanical damage and the change in resistance between the initial and final measurement
at +25°C ±5°C shall not exceed ±(0.25 percent +0.05 ohm).
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