MIL-PRF-39017 Resistors, Fixed, Film \(Insulated\), Nonestablished Reliability, And Established Reliability, General Specification ForThis specification covers the general requirements for nonestablished reliability \(non-ER\) and established reliability \(ER\), insulated, film, fixed resistors. These resistors are capable of full load operation at an ambient temperature of 70 Degrees C and have a resistance temperature characteristic of 100 parts per million \(PPM\) and 350 PPM per degree Celsius \(PPM/Degrees C\). The ER resistors have life failure rate \(FR\) levels ranging from 1.0 percent to 0.001 percent per 1,000 hours \(see 1.2.1.4\). These FR levels are established at a 60 percent confidence level on the basis of life tests. Designers are CAUTIONED on using these resistors in high power pulse applications \(see 6.13.2\).

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MIL-PRF-39017G

3.8 Power conditioning. When resistors are tested as specified in 4.8.2, there shall be no evidence of

mechanical damage and the change in resistance shall not exceed �(0.5 percent +0.05 ohm for 100

PPM) or �(1 percent +0.05 ohm for 350 PPM).

3.9 DC resistance. When resistors are tested as specified in 4.8.3, the dc resistance shall be within

the specified tolerance of the nominal resistance (see 1.2.1.5).

3.9.1 Resistance value deviations. All maximum deviations as specified in this section are to be

considered absolute limits with the exception of the contact resistance adjustments.

3.10 Thermal shock. When resistors are tested as specified in 4.8.4, there shall be no evidence of

mechanical damage, and the change in resistance shall not exceed �(0.25 percent +0.05 ohm for 100

PPM) or �(1.0 percent +0.05 ohm for 350 PPM).

3.11 Resistance temperature characteristic. When resistors are tested as specified in 4.8.5, the

change in resistance at any temperature within the test temperature range, referred to an ambient

temperature of 25�C, shall not exceed �0.010 percent per degree Celsius (100 PPM/�C) or �0.035

percent per degree Celsius (350 PPM/�C) as applicable.

3.12 Low temperature storage. When resistors are tested as specified in 4.8.6, there shall be no

evidence of mechanical damage and the change in resistance between the initial and final measurements

at 25�C �5�C shall not exceed �(0.25 percent +0.05 ohm for 100 PPM) or �(0.5 percent +0.05 ohm for

350 PPM).

3.13 Low temperature operation. When resistors are tested as specified 4.8.7, they shall be no

evidence of mechanical damage and the change in resistance between the initial and final measurements

at 25�C �5�C shall not exceed �(0.25 percent +0.05 ohm for 100 PPM) or �(0.5 percent +0.05 ohm for

350 PPM).

3.14 Short-time overload. When resistors are tested as specified in 4.8.8, there shall be no evidence

of arcing, burning, or charring and the change in shall not exceed �(0.5 percent +0.05 ohm for 100 PPM)

or �(1.0 percent +0.05 ohm for 350 PPM).

3.15 Terminal strength

3.15.1 Direct load. When resistors are tested as specified in 4.8.9, resistors shall withstand the

specified load without mechanical damage and the change in resistance shall not exceed �(0.25 percent

+0.05 ohm for 100 PPM) or �(0.5 percent +0.05 ohm for 350 PPM).

3.15.2 Twist. When resistors are tested as specified in 4.8.9.1, there shall be no evidence of breakage

or other mechanical damage and the change in resistance shall not exceed �(0.25 percent +0.05 ohm).

3.16 Solderability. When resistors are tested as specified in 4.8.10, they shall meet the criteria for wire

lead terminal evaluation in the test method.

3.17 Resistance to solvents. When resistors are tested as specified in 4.8.11, there shall be no

evidence of mechanical damage and the markings shall remain legible.