MIL-PRF-39015E
3.25 Low temperature operation. When resistors are tested as specified 4.8.19, they shall meet the
following requirements:
Change shall not exceed 0.5 percent plus the specified maximum
Setting stability:
resolution (see 3.1).
Total resistance:
Change shall not exceed ±1 percent for resistance values of 100 ohms
or greater, and ±(1.0 percent +0.05 ohm) for values below 100 ohms.
Visual examination:
There shall be no evidence of mechanical damage.
3.26 Low temperature storage (for qualification only). When resistors are tested as specified in 4.8.20,
the change in total resistance shall not exceed ±1 percent for resistance values of 100 ohms or greater,
and ±(1.0 percent +0.05 ohm) for values below 100 ohms. There shall be no evidence of mechanical
damage.
3.27 High temperature exposure. When resistors are tested as specified 4.8.21, they shall meet the
following requirements:
Change shall not exceed 0.5 percent plus the specified maximum
Setting stability:
resolution (see 3.1).
Total resistance:
Change shall not exceed ±1 percent for resistance values of 100 ohms
or greater, and ±(1.0 percent +0.05 ohm) for values below 100 ohms.
Dielectric withstanding voltage
As specified in 3.14.
(atmospheric pressure):
Insulation resistance:
Shall not be less than 1,000 megohms.
Visual examination:
There shall be no evidence of mechanical damage.
3.28 Integrity of shaft. When resistors are tested as specified 4.8.22, the shaft shall remain in one piece.
3.29 Rotational life. When resistors are tested as specified in 4.8.23, the change in total resistance
shall not exceed ±2 percent, and there shall be no evidence of mechanical damage. The failure of one
pair of units being tested shall not count as a failure for the companion unit.
3.30 Terminal strength. When resistors are tested as specified in 4.8.24, there shall be no evidence of
mechanical damage and resistors shall be electrically continuous.
3.31 Life.
3.31.1 Qualification. When resistors are tested as specified in 4.8.25, there shall be no evidence of
mechanical damage. The change in resistance between the initial measurement and any of the
succeeding measurements up to and including 2,000 hours shall not exceed ±2 percent plus specified
maximum resolution (see 3.1).
3.31.2 FR level determination. When resistors are tested as specified in 4.8.25, there shall be no
evidence of mechanical damage to the resistance element or enclosure. The change in resistance
between the initial measurement and any of the succeeding measurements shall not exceed ±3 percent
plus the specified resolution. This single failure criterion shall be applicable to all measurements during
the life test for purposes of determining FR level qualification and is applicable as a parallel requirement
with 3.31.1 to the measurements made during the life test specified for the qualification test.
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