MIL-PRF-39005G
3.17 Vibration, high frequency. When resistors are tested as specified in 4.8.13, there shall be no
evidence of mechanical or electrical damage. The change in resistance shall not exceed ±0.01 percent
for resistance values of 10 ohms and above, and ±(0.01 percent +0.01 ohm) for values less than 10
ohms.
3.18 Resistance temperature characteristic. When resistors are tested as specified in 4.8.14, the
resistance temperature characteristic, referred to an ambient temperature of 25°C, shall not exceed the
value specified in table VI.
TABLE VI. Maximum RTC.
Resistance
Percent/°C
Parts/million/°C
Less than 1 ohm
±0.009
±90
1 ohm to less than 10 ohms
±0.003
±30
10 ohms to less than 100 ohms
±0.0015
±15
100 ohms and above
±0.0010
±10
3.19 Low temperature storage. When resistors are tested as specified in 4.8.15, there shall be no
evidence of mechanical damage. The change in resistance between initial and final measurements at
25°C ±5°C shall not exceed ±0.01 percent for resistance values of 10 ohms and above, and ±(0.01
percent +0.01 ohm) for values less than 10 ohms.
3.20 Low temperature operation. When resistors are tested as specified in 4.8.16, there shall be no
evidence of mechanical damage. The change in resistance between initial and final measurements at
25°C ±5°C shall not exceed ±0.01 percent for resistance values of 10 ohms and above, and ±(0.01
percent +0.01 ohm) for values less than 10 ohms.
3.21 Life.
3.21.1 Qualification. When resistors are tested as specified in 4.8.17, there shall be no evidence of
mechanical damage to the resistance element, coating, or enclosure. The change in resistance between
the initial and any succeeding measurement shall not exceed ±(0.1 percent +0.01 ohm).
3.21.2 FRL determination (extended FR test) (ER only). When resistors are tested as specified in
4.8.17, there shall be no evidence of mechanical damage to the resistance element, coating, or
enclosure. The change in resistance between initial and any succeeding measurement shall not exceed
±(0.2 percent +0.01 ohm). This single failure criterion shall be applicable as a parallel requirement to all
measurements during the life test for purposes of determining FRL qualification.
3.22 Fungus. All external materials shall be nonnutrient to fungus growth or shall be treated to retard
fungus growth. The manufacturer shall certify that all external materials are fungus resistant, or shall
perform the test specified in 4.8.18. There shall be no evidence of fungus growth on the external
surfaces.
3.23 Resistance to solvents. When resistors are tested as specified in 4.8.19, there shall be no
evidence of mechanical damage and the markings shall remain legible.
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