MIL-PRF-39005G
3.29 Workmanship. Resistors shall be processed in such a manner as to be uniform in quality and free
from any defects that will affect life, serviceability, or appearance.
4. VERIFICATION
4.1 Classification of inspection. The inspection requirements specified herein are classified as follows:
a. Qualification inspection (see 4.4).
b. Verification of qualification (see 4.5).
c. Conformance inspection (see 4.6).
d. Periodic group C inspection (see 4.7).
4.2 Reliability and quality.
4.2.1 QPL system. The manufacturer shall establish and maintain a QPL system as described in 3.3.
Evidence of such compliance is a prerequisite for qualification and retention of qualification.
4.2.2 SPC. A SPC program shall be maintained in accordance with EIA-557. Evidence of such
compliance shall be verified by the qualifying activity of this specification as prerequisite for qualification
and continued qualification.
4.3 Inspection conditions and precautions.
4.3.1 Inspection conditions. Unless otherwise specified herein, all inspections shall be performed in
accordance with the test conditions specified in the "GENERAL REQUIREMENTS" of MIL-STD-202.
4.3.2 Precautions. Adequate precautions shall be taken during inspection to prevent condensation of
moisture on resistors except during the moisture resistance temperature cycling tests. Precautions shall
also be taken to prevent damage by heat when soldering resistor leads to terminals.
4.4 Qualification inspection. Qualification inspection shall be performed at a laboratory acceptable to
the Government.
4.4.1 Sample. The number of sample units comprising a sample of resistors to be submitted for
qualification inspection shall be as specified in the appendix A to this specification. The sample shall be
taken at random from a production run and shall be produced with equipment and procedures normally
used in production. Each resistor style shall be qualified separately.
4.4.2 Test routine. Sample units shall be subjected to the qualification inspection specified in table IX,
in the order shown. All 324 sample units shall be subjected to the inspection of group I and group IA.
The 324 sample units shall then be divided as specified in table IX for group II through group VI inclusive
and group VIII, and subjected to the inspection for their particular group. An additional 10 to 20 sample
units, as applicable, and 19 additional sample units shall be subjected to the inspection of group IB and
group VII, respectively.
4.4.3 Defectives. Defectives in excess of those allowed in table IX shall be cause for refusal to grant
qualification.
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