MIL-PRF-83530C
4.8.19 Shock (see 3.24). Resistors shall be tested in accordance with method 213 of MIL-STD-202. The following
details and exceptions shall apply:
a.
Mounting - Resistors shall be rigidly fastened to the test platform and the leads secured.
b.
Voltage applied - Resistors shall not be energized.
c.
Test condition - E, except 1 ms duration.
Measurements after test - Nominal voltage and clamping voltage shall be measured as specified in 4.8.2 and
d.
4.8.3 respectively.
e.
Examination after test - Resistors shall be visually examined for evidence of mechanical damage.
MIL-STD-202. The following details and exceptions shall apply:
a.
Mounting - Resistors shall be rigidly fastened to the test platform and the leads secured.
b.
Voltage applied - Resistors shall not be energized.
c.
Test condition - B; 20,000 g in the y2 orientation.
Measurements after test - Nominal voltage and clamping voltage shall be measured as specified in 4.8.2 and
d.
4.8.3 respectively.
e.
Examination after test - Resistors shall be visually examined for evidence of mechanical damage.
4.8.21 Low temperature storage (see 3.26).
4.8.21.1 Mounting. Resistors shall be mounted in a manner such that there is at least one inch of free air space
around each resistor, and in such a position with respect to the air stream that the mounting offers substantially no
obstruction to the flow of air across and around the resistors.
O
O
O
4.8.21.2 Procedure. Resistors shall be placed in a cold chamber which is at -65 C +0 , -3 C for a period of
24 hours ±4 hours. The resistors shall then be removed from the chamber and maintained at a temperature of
25OC ±5OC for a period of 6 hours ±2 hours. The nominal voltage and clamping voltage shall then be measured as
specified in 4.8.2 and 4.8.3 respectively. The resistors shall be visually examined for evidence of mechanical
damage.
4.8.22 High temperature storage (see 3.27).
4.8.22.1 Mounting. Resistors shall be mounted as specified in 4.8.21.1.
4.8.22.2 Procedure. Resistors shall be placed in a chamber which is at 125OC +3O, -0OC for a period of
340 hours ±8 hours. The resistors shall then be removed from the chamber and maintained at a temperature of 25OC
±5OC for a period of 6 hours ±2 hours. The nominal voltage and clamping voltage shall then be measured as
specified in 4.8.2 and 4.8.3 respectively. The resistors shall then be visually examined for evidence of mechanical
damage.
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