MIL-PRF-83530C
4.8 Methods of inspection.
4.8.1 Visual and mechanical examination. Resistors shall be examined to verify the materials, design,
construction, physical dimensions, marking and workmanship are in accordance with the applicable requirements
TABLE VIII. Defects.
Defects
Cracks, voids, chips or holes in the resistor body which would
expose the resistor element or could cause probable failure.
Leads or terminals which are broken, crushed or nicked which
would cause probable failure in use.
Body or lead dimensions out of specification.
Incorrect, illegible marking.
4.8.2 Nominal voltage (see 3.7). Resistors shall be tested in accordance with method 4022 of MIL-STD-750. The
following details and exceptions shall apply:
a.
Test current - 1.0 ±0.1 mA dc.
b.
Time of test current application prior to voltage reading - 5 milliseconds minimum, 5 seconds maximum.
c.
Method of mounting - not specified.
d.
Resistors shall be tested in both polarities.
4.8.3 Clamping voltage (see 3.8). Resistors shall be tested in accordance with method 4011 of MIL-STD-750. The
following details and exceptions shall apply:
Test current - An impulse with waveform of 8 x 20 μS (see 6.5.2) and peak value, ±5% as specified
a.
(see 3.1).
b.
Pulse repetition rate - Shall not exceed one per second.
c.
Resistors shall be tested in both polarities.
4.8.4 Capacitance (see 3.9). Resistors shall be tested in accordance with method 4001 of MIL-STD-750. The
following details and exceptions shall apply:
a.
DC bias voltage - Shall not be applied.
b.
Test voltage - 1.0 ±0.1 V rms.
c.
Test frequency - 1.0 MHz ±5%.
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