MIL-PRF-26H
3.9 Solderability (when applicable) (see 4.7.5). When resistors are tested as specified in 4.7.5, the dipped surface
of the lead shall be at least 95 percent covered with continuous new solder coating. The remaining 5 percent of the
lead surface may show only small pinholes or voids. These shall not be concentrated in one area. Bare base metal,
and areas where the solder dip failed to cover the original coating are indications of poor solderability, and shall be
cause for failure.
3.10 Terminal strength. When resistors are tested as specified in 4.7.6, there shall be no evidence of breaking or
loosening of terminals from the resistor form, or chipping of coating or other evidence of mechanical damage.
Chipping of the coating on the leads is permissible as long as the end caps are not exposed. The change in
resistance shall not exceed the values specified (see 3.1).
3.11 Resistance-temperature characteristic. When resistors are tested as specified in 4.7.7, the resistance
temperature characteristic referred to an ambient temperature of 25OC shall not exceed the values specified
(see 3.1).
3.12 Dielectric withstanding voltage. When resistors are tested as specified in 4.7.8, there shall be no evidence of
flashover, mechanical damage, arcing, or insulation breakdown. The change in resistance shall not exceed the
values specified (see 3.1).
3.13 Insulation resistance. When resistors are tested as specified in 4.7.9, the insulation resistance shall be not
less than 1,000 megohms.
3.14 High-temperature exposure. When resistors are tested as specified in 4.7.10, there shall be no damage or
loosening under a mounting bolt. The change in resistance shall not exceed the values specified (see 3.1).
3.15 Moisture resistance. When resistors are tested as specified in 4.7.11, there shall be no evidence of breaking
or loosening of terminals from the resistor form or chipping of coating or other evidence of mechanical damage. The
change in resistance shall not exceed the values specified (see 3.1). The insulation resistance shall be 100
megohms, minimum.
3.16 Low-temperature storage. When resistors are tested as specified in 4.7.12, there shall be no evidence of
mechanical damage. The change in resistance between the initial and final resistance measurements at 25OC ±5OC
shall not exceed the values specified (see 3.1).
3.17 Mechanical strength (not applicable to axial-terminal resistors). When tested as specified in 4.7.13, resistors
shall show no mechanical damage.
3.18 Shock, specified pulse (applicable to axial-lead resistors, only). When resistors are tested as specified in
4.7.14, there shall be no evidence of mechanical or electrical damage. The change in resistance shall not exceed the
values specified (see 3.1). There shall be no electrical discontinuity during the test.
3.19 Vibration, high frequency (applicable to axial-lead resistors, only). When resistors are tested as specified in
4.7.15, there shall be no evidence of mechanical damage. The change in resistance shall not exceed the values
specified (see 3.1). There shall be no electrical discontinuity during the test.
3.20 Life.
3.20.1 Qualification inspection. When resistors are tested as specified in 4.7.16, there shall be no evidence of
mechanical damage. The change in resistance between the initial measurement and any of the succeeding
measurements shall not exceed the values specified (see 3.1).
3.20.2 Conformance inspection. When resistors are tested as specified in 4.7.16, there shall be no evidence of
mechanical damage. The change in resistance between the initial measurement and the final measurement shall not
exceed the values specified (see 3.1).
6
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business