MIL-PRF-23648F
TABLE VI. Group A sampling plan.
Lot size
Subgroup 1
Subgroup 2
sample size
sample size
5
100 percent
1 to
4
5
100 percent
5 to
125
5
125
126 to
3200
8
125
3,201 to 10,000
13
294
10,001 to 35,000
20
294
35,001 to 150,000
20
345
150,001 to 500,000
20
435
500,001 and over
4.6.2.2.1 Disposition of samples. The solderability test is considered a destructive test and samples
submitted to the solderability test shall not be supplied on the contract.
4.6.3 Group B inspection. Group B inspection shall consist of the test specified in table VII in the order
shown. They shall be performed on sample units that have passed the group A tests, unless the
Government considers it more practical to select a separate sample from the lot for group B inspection.
TABLE VII. Group B inspection. 1/
Inspection
Requirement
Method
paragraph
paragraph
Subgroup 1
Short time overload
Insulation resistance
Dielectric withstanding voltage
Low temperature storage
High temperature storage
Subgroup 2
Resistance to solvents
1/ If the manufacturer can demonstrate that this test has been performed five
consecutive times with zero failures, the frequency of this test, with the
approval of the qualifying activity, can be performed on an annual basis. If
the design, material, constructions, or processing of the part is changed, or
if there are any quality problems or failures, the qualifying activity may
require resumption of the original test frequency.
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