MIL-PRF-94G
3.25 Recycled, recovered, or environmentally preferable materials. Recycled, recovered, or environmentally
preferred materials should be used to the maximum extent possible provided that the materials meets or exceeds the
operational and maintenance requirements, and promotes economically advantageous life cycle costs.
3.26 Workmanship. Resistors shall be processed in such a manner as to be uniform in quality and shall be free of
any defects that will affect life, serviceability or appearance
4. VERIFICATION
4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:
Qualification inspection (see 4.4).
a.
b.
Conformance inspection (see 4.6).
4.2 Test equipment and inspection facilities. The manufacturer shall establish and maintain a calibration system in
accordance with ANSI/NCSL Z540-1, ISO 10012-1, or equivalent system as approved by the qualifying activity.
4.3 Inspection conditions and precautions.
4.3.1 Inspection conditions. Unless otherwise specified herein, all inspections shall be in accordance with the test
4.3.2 Precautions. Adequate precautions shall be taken during inspection to prevent condensation of moisture on
resistors (except during the moisture resistance test). Precautions shall also be taken to prevent damage by heat
when soldering resistor leads to terminals.
4.4 Qualification. Qualification inspection shall be performed at a laboratory acceptable to the Government (see
6.3) on sample units produced with equipment and procedures normally used in production.
4.4.1 Sample size. The number of sample units comprising a sample of resistors to be subjected for qualification
inspection shall be as specified in the appendix A to this specification.
4.4.2 Inspection routine.
4.4.2.1 Single type submission. The sample shall be subjected to the examination and tests specified in table VIII,
in order shown. Six sample units shall be subjected to the examination and tests of group I. An additional six sample
units shall be subjected to group II. All sample units, except those subjected to group II, shall then be placed in a dry
oven and maintained for 24 hours ± 4 hours at a temperature of 40 C ±5 C, then removed and placed in a desiccator
O
O
using a desiccant, such as activated alumina or silica gel, before being subjected to the tests of group III to VIII,
inclusive. The six sample units subjected to the examination and tests of group I shall also be subjected to the tests
of group III. Twenty-four of the remaining sample units shall be equally divided into four groups and subjected to the
tests of group IV to VII, inclusive. Ten sample units shall be subjected to tests of group VIII. Ten units shall be
submitted to group IX (see 3.20).
4.4.2.2 Combined type submission. The sample shall be subjected to the examination and tests specified in table
VIII and table IX, as applicable, in the order shown. The sample units shall be assigned to groups in accordance with
table A-I or table A-II, as applicable. After examination and tests of group I and II, all resistors, except those
subjected to group II shall be placed in a dry oven and maintained for 24 hours ±4 hours at temperature of 40OC
O
±5 C, then removed and placed in a desiccator using a suitable desiccant, such as activated alumina or silica gel,
before being subjected to the tests of group III to VIII, inclusive, of table A-I or groups II or III, of table A-II, as
applicable. Ten sample units shall be submitted to group IX.
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