MIL-PRF-22684F
APPENDIX A
PROCEDURE FOR QUALIFICATION INSPECTION
A.1 SCOPE
A.1.1 Scope. This appendix describes the procedure for submission of samples, with the results, for qualification
inspection of resistors covered by this specification. The procedure for extending qualification of the required sample
to other resistors covered by this specification is also outlined herein. This appendix is a mandatory part of the
specification. The information contained herein is intended for compliance only.
A.2. APPLICABLE DOCUMENTS
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A.2.1 General. The documents listed in this section are specified in sections 3, 4, and 5 of this specification. This
section does not include documents cited in other sections of this specification or recommended for additional
information or as examples. While every effort has been made to ensure the completeness of this list, document
users are cautioned that they must meet all specified requirements documents cited in sections 3, 4, and 5 of this
specification, whether or not they are listed.
A.2.2 Government documents.
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A.2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a
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part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are
those cited in the solicitation or contract.
DEPARTMENT OF DEFENSE STANDARDS
Leads for Electronic Component Parts.
(Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or https://assist.daps.dla.mil
or from the Standard Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia PA 19111-5094.)
A.2.3 Order of precedence. In the event of a conflict between the text of this document, and the references cited
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herein (except for associated specifications, specification sheets, or MS sheets); the text of this document takes
precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific
exemption has been obtained.
A.3 SUBMISSION
A.3.1 Sample. A sample consisting of 50 sample units, each of the lowest and highest resistance values in each
style, terminal, and resistance tolerance for which qualification is sought, shall be submitted. When the lowest and
highest resistance values submitted are respectively below and above the critical value specified in table A-I, 50
sample units of the critical value shall also be submitted in each style. One additional sample unit of each resistance
value shall be submitted to permit substitution for the allowable defect in group I inspection.
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