MIL-PRF-22684F
4.5.1.3.1.3 Subgroup 3 (solderability).
4.5.1.3.1.3.1 Sampling plan. Thirteen samples shall be selected randomly from each inspection lot and subjected
to the Subgroup 3 solderability test. If there are one or more defects, the lot shall be considered to have failed.
4.5.1.3.1.3.2 Rejected lots. In the event of one or more defects, the inspection lot is rejected. The manufacturer
may use one of the following options to rework the lot:
a. Each production lot that was used to form the failed inspection lot shall be individually submitted to the
solderability test as required in 4.6.15. Production lots that pass the solderability test are available for
shipment. Production lots failing the solderability test can be reworked only if submitted to the solder dip
procedure in (b).
b. The manufacturer submits the failed lot to a 100 percent solder dip using an approved solder dip process (see
Appendix A) per 3.4.2. Following the solder dip the electrical measurements required in Group A Subgroup 1
tests shall be repeated on the lot. Thirteen additional samples shall then be selected and subjected to the
solderability test with zero defects allowed. If the lot fails this solderability test the lot shall be reworked a
second time and retested. If the lot fails the second rework, the lot shall be considered rejected and shall not
be furnished against the requirements of this specification.
4.5.1.3.1.3.3 Disposition of samples. The solderability test is considered a destructive test and samples submitted
to the solderability test shall not be supplied on the contract.
4.5.1.4 Group B inspection. Group B inspection shall consist of the tests specified in table V, in the order shown.
They shall be performed on sample units that have been subjected to and have passed the group A inspection,
unless the Government considers it more practical to select a separate sample from the lot for its group B inspection.
Sample units shall be selected so that no more than three voltages will be required for the short-time overload test.
4.5.1.4.1 Sampling plan. A sample of 13 parts shall be randomly selected, if one or more defects are found, the lot
shall be screened and defects removed. After screening and removal of defects, a new sample of 13 parts shall be
randomly selected, if one or more defects are found in the second sample, the lot shall be rejected and shall not be
supplied to this specification.
4.5.1.4.2 Disposition of sample units. Sample units which have passed all the group B inspection may be delivered
on the contract or order, at the option of the supplier, provided the resistor terminals were not soldered during any of
the tests.
TABLE V. Group B inspection. 1/
Test
Requirement
Method
Number of
paragraph
Paragraph
samples
Resistance-temperature characteristic
Short-time overload
Resistance to solvents
(Alpha-numeric marking)
1/ If the manufacturer can demonstrate that these tests have been performed five
consecutive times with zero failures, the frequency of these tests, with the approval of
the qualifying activity, can be performed on an annual basis. If the design, material,
construction, or processing of the part is changed, or if there are any quality problems
or failures, the qualifying activity may require resumption of the original test frequency.
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