MIL-PRF-94G
4.6.1.2.1.3.1 Sampling plan. Five samples (13 samples for RV8) shall be selected randomly from each inspection
lot and subjected to the subgroup 3 solderability test. If one or more defects, the lot shall be considered to have
failed.
4.6.1.2.1.3.2 Rejected lots. In the event of one or more defects, the inspection lot is rejected. The manufacturer
may use one of the following options to rework the lot;
a.
Each production lot that was used to form the failed inspection lot shall be individually submitted to the
solderability test as required in 4.7.5. Five samples shall be selected from each production lot that formed
the failed inspection lot. Production lots that pass the solderability test are available for shipment.
Production lots failing the solderability test can be reworked only if submitted to the solder dip procedure
in 4.6.1.2.1.3.2b.
b.
The manufacturer submits the failed lot to a 100 percent solder dip using an approved solder dip process in
accordance with the 3.4.4.1. Following the solder dip the electrical measurements required in group A,
subgroup 2 tests shall be repeated on 100 percent of the lot. The Percent Defective Allowable (PDA) for the
electrical measurements shall be as for the subgroup 1 tests. Five (13 samples of RV8) additional samples
shall then be selected and subjected to the solderability test with zero defects allowed. If the lot fails the
solderability test, the lot may be reworked and retested. If the lot fails a second rework, the lot shall be
rejected and shall not be furnished against the requirements of this specification.
4.6.1.2.1.3.3 Disposition of samples. The solderability test is considered a destructive test and samples submitted
to the solderability test shall not be supplied on the contract.
4.6.1.3 Group B inspection. Group B inspection shall consist of the tests specified in table XII, in the order shown,
and the sample shall be selected from the inspection lots that have passed group A inspection.
TABLE XII. Group B inspection.
Requirement
Method
Examination or test
paragraph
paragraph
Resistance taper
Minimum resistance
Torque
Dielectric withstanding voltage
4.6.1.3.1 Sampling plan. A sample of parts from each inspection lot shall be randomly selected in accordance with
table XIII, if one or more defects are found, the lot shall be rescreened and defects removed. After reworking or
screening of the lot and removal of defectives, a new sample of parts shall be randomly selected in accordance with
table XIII. If one or more defects are found in the second sample, the lot shall not be supplied to this specification.
TABLE XIII. Group B sampling plan.
Lot size
Sample size
1
to
25
3
26
to
50
5
51
to
90
6
91
to
150
7
151
to
280
10
281
to
500
11
501
to
1,200
15
1,201
to
3,200
18
3,201
to
10,000
22
10,001
to
35,000
29
35,001
and
over
29
14
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