MIL-PRF-39035E
4.6.3.2.5 Subgroup 4 (solderability). The subgroup 4 tests shall be performed on an inspection lot basis for ER
parts. A sample shall be selected from each lot in accordance with table IX. As an option, the manufacturer may use
electrical rejects from the subgroup 1 tests for all or part of the sample. If there are one or more defects, the lot is
rejected. The manufacturer may use one of the following options for corrective action:
a.
Each production lot that was used to form the failed inspection lot shall be individually submitted to the
solderability test. Production lots that pass the solderability test are available for shipment. Production
lots failing the solderability test can be submitted to the solder dip procedure in 4.6.3.2.5b.
b.
The lot is submitted to a 100 percent solder dip using an approved solder dip process in accordance with
the appendix A. A subsequent solderability test shall then be performed. If the lot passes, it is available
for shipment; if the lot fails, the manufacturer may perform the hot solder dip one additional time. If the lot
fails to pass, the lot is considered rejected and shall not be supplied to this specification.
TABLE IX. Solderability sampling plan.
Sample
Lot size
size
1
to
3,200
5
3,201
to 10,000
8
10,001
to 35,000
13
35,001
and over
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4.6.3.2.5.1 Disposition of samples. The solderability test is considered a destructive test and samples submitted to
the solderability test shall not be supplied to this specification.
4.6.4 PPM assessment (non-ER and ER). The manufacturer shall establish and maintain a system for assessing
the average outgoing quality in ppm of lots supplied to this specification. This ppm assessment should be based on
inspections performed on each inspection lot, verify that resistors meet total resistance, and tolerance requirements
(i.e., ppm). For ER resistors, this inspection shall occur after the group A, subgroup 1, 100 percent screens have
been completed. In the event of one or more failures, the lot is rejected.
4.6.4.1 Sampling plan. Minimum sample sizes for inspection lots shall be selected in accordance with table IX.
For non-ER resistors, the sampling system and plan used for the group A inspection (see 4.6.3.1) may be the basis
for assessing ppm.
4.6.4.2 Rejected lots. Any rejected lot shall be segregated from new lots and those lots that have passed ppm
assessment. A rejected lot may be rescreened for the quality characteristics found defective in the sample and any
defects removed. A new second sample shall be randomly selected. If one or more defects are found, this lot is
rejected and shall not be supplied to this specification.
4.6.4.3 PPM calculations. PPM calculations shall be based on the accumulated results of the initial sample.
Calculations and exclusion shall be in accordance with EIA-554-1 and qualifying activity approval. (Note: PPM
calculations shall not be based on the second sample submission for a rejected lot as described in 4.6.4.2).
4.7 Periodic group B inspection (ER only). Periodic inspection shall consist of group B inspection tests specified in
table X, in the order shown. They shall be performed on sample units selected from lots that have passed the group
A inspection. Except where the results of this inspection show noncompliance with the applicable requirements
(see 4.7.5), delivery of products which have passed group A inspection shall not be delayed pending the results of
periodic inspections.
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