MIL-PRF-39035E
e.
Measurements during vibration: As specified in 4.8.17e.
Measurements after vibration: As specified in 4.8.17f.
f.
g.
Examination after vibration: Resistors shall be examined for evidence of mechanical damage.
4.8.19 Salt spray (corrosion) (see 3.24). The resistors shall be tested in accordance with method 101 of
MIL-STD-202. The following details shall apply:
a.
Special mounting: As specified in 4.8.15a.
b.
Test condition: A.
c.
Examination after exposure: Resistors shall be examined for corrosion and mechanical operation.
4.8.20 Resistance to soldering heat (not applicable to L type terminals) (see 3.25). The resistors shall be tested in
Measurement before test: Total resistance shall be measured as specified in 4.8.5.1.
a.
Test condition: C - except time shall be 10 seconds ±1 second.
b.
c.
Measurement after test: One hour after completion of test, the total resistance shall be measured as
specified in 4.8.5.1. Resistors shall be examined for evidence of mechanical damage.
4.8.21 Low temperature operation (see 3.26).
4.8.21.1 Mounting. The resistors shall be mounted in such a manner as to allow electrical connections to be made
to the terminals.
4.8.21.2 Procedure. Total resistance shall be measured as specified in 4.8.5.1. The resistors shall be placed in a
chamber at room temperature. The temperature shall be gradually decreased to -55OC +0OC, -5OC within a period of
not less than 1.5 hours. For conformance inspection only, and at the option of the manufacturer, the resistors may be
placed in the chamber when the chamber is already at the extreme low temperature. After one hour of stabilization at
this temperature, setting stability shall be measured as specified in 4.8.12. Full rated continuous working voltage
(see 3.1 and 3.7) shall be applied for 45 minutes. The resistors may be loaded individually or in parallel. Fifteen
minutes, +5 minutes, -0 minutes after removal of voltage, setting stability shall be measured as specified in 4.8.12.
The temperature in the chamber shall be gradually increased to room temperature within a period of not more than 8
hours. The resistors shall be removed from the chamber, and maintained at a temperature of 25OC ± 5OC for a
period of approximately 24 hours. Total resistance shall be measured as specified in 4.8.5.1. Resistors shall then be
examined for evidence of mechanical damage.
4.8.22 High temperature exposure (see 3.27).
4.8.22.1 Mounting. The resistors shall be mounted in such a manner as to allow electrical connections to be made
to the terminals.
4.8.22.2 Procedure. Total resistance and setting stability shall be measured as specified in 4.8.5.1 and 4.8.12,
respectively. The resistors shall be exposed to an ambient temperature of 150OC +5OC, -0OC for a period of 1,000
hours ±8 hours. Not less than 2 hours after the end of the exposure period, setting stability and total resistance shall
be measured as specified in 4.8.12 and 4.8.5.1, respectively. Dielectric withstanding voltage (at atmospheric
pressure), and insulation resistance shall be measured as specified in 4.8.8.1 and 4.8.9, respectively. Resistors shall
then be examined for evidence of mechanical damage.
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